Load Pull measurements serve as a technique to study the non-linear RF properties of an active device under non-50 Ohm conditions. By driving an active device into compression and modifying the load, users can acquire comprehensive knowledge about the device’s performance in its non-linear region and throughout the impedance plane.

​​​​​​​Conventional linear models have consistently struggled to accurately predict a device’s genuine non-linear behavior. In contrast, Load Pull, rooted in real-world measurements, provides a high level of accuracy in forecasting a device’s behavior for a specific bias point and frequency.

​​​​​​​

The application of Load Pull can span from basic to sophisticated. It can be as simple as employing a fundamental tuner for ruggedness testing, which involves adjusting the load of an active device at a constant VSWR. It can also be more complex when an RF designer is interested in examining the linearity effects when changing the second harmonic impedance on the source side of the active device.

WAVEPIA conducts load pull measurements, enabling a deeper understanding of its self-designed chips which guarantees enhanced performance of the products and also is able to provide chip-based simulation data upon requests.